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1G-05 SYSTEM SQUARE INC. 株式会社SYSTEM SQUARE(世高)

Dual energy X-ray inspection system

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  • Product Catalogs

SYSTEM SQUARE's Evolving Dual Energy X-ray Inspection System
With high-contrast and high-resolution inspection images, it is now possible to detect foreign objects that traditional X-ray systems could not.

  • Measurement, Analysis, and Inspection
    • Foreign-object detectors
    • X-ray sensor

Overview of Products, Technologies, and Services

Using our proprietary high-precision dual-energy sensor, foreign objects can now be detected with clearer images compared to our previous models. By processing two images with different energy bands, the system minimizes the effect of the product and accurately detects only the foreign objects.

Product Features

  • [High Contrast & High Resolution]
    Products with thickness or uneven surfaces are captured with high contrast and high resolution, allowing foreign objects to be displayed more clearly.
  • [Detection of Thin Bones and Low-Density Foreign Objects]
    The system detects thin bones and low-density foreign objects like resin with high sensitivity.
    It can detect residual bones that are difficult to identify with standard X-ray inspection, reducing bone-related complaints.
  • [Minimizing False Detection in Overlapping or Uneven Products]
    The system excels at inspecting overlapping or uneven products and can detect small foreign objects with high sensitivity.
    It helps reduce false detections caused by overlapping products in bulk or large bags.